Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT

You, Hyun-Jong; Choo, Wonil; Jang, Soouk

doi:10.18429/JACoW-IBIC2015-MOPB035

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Text citation export for MOPB035: Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT

   H.J. You, W.I. Choo, and S.O. Jang,
   "Beam Profile Measurements with a Slit-Faraday Cup and a Wire Scanner for a Newly Developed 18 GHz Superconducting ECR Ion Source and its LEBT",
   in Proc. 4th International Beam Instrumentation Conference, Melbourne, Australia, September 2015, paper MOPB035, pp. 113-117,
   ISBN: 978-3-95450-176-2,
   doi:10.18429/JACoW-IBIC2015-MOPB035,
   http://accelconf.web.cern.ch/AccelConf/IBIC2015/papers/mopb035.pdf, 2016.