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TY - CPAPER AU - Zhang, L.G. AU - Huang, J. AU - Liu, K.F. AU - Yang, J. AU - Zuo, C. TI - Electron Beam Uniformity Detection Device for Irradiation Accelerators J2 - Proc. of International Beam Instrumentation Conference (IBIC2015), Melbourne, Australia, 13-17 September 2015 AB - High-voltage electron accelerators are widely used in the irradiation processing industry. Beam uniformity of the accelerator has a very important impact on the quality of irradiated products. Accurate measurement of beam uniformity helps to improve product quality and production efficiency. In this paper, the electron beam uniformity detection device is designed based on a Faraday cup array followed by the signal shaping circuit and the digital signal processing system. Finally, the computer offers a friendly interface to help users understand the operating state of the accelerator and the electron beam uniformity information. This device uses DSP technology to process the signal and optical fibre to communicate which greatly improves the noise immunity capability of the system. Through such a high precision and easy to use detection device, a user can get the accelerator beam irradiation uniformity information which is very useful for guiding the industry radiation process. PB - JACoW CY - Geneva, Switzerland SP - 101 EP - 103 KW - electron KW - radiation KW - interface KW - simulation KW - high-voltage DA - 2016/01 PY - 2016 SN - 978-3-95450-176-2 DO - 10.18429/JACoW-IBIC2015-MOPB031 UR - http://accelconf.web.cern.ch/AccelConf/IBIC2015/papers/mopb031.pdf ER -