%\cite{Kim:IBIC2014-TUPD16}
\bibitem{Kim:IBIC2014-TUPD16}
    I.Y.~Kim, J.Y.~Choi, H.~Heo, H.-S.~Kang, C.~Kim, G.~Mun, B.G.~Oh, and S.J.~Park,
%   I.Y. Kim \emph{et al.},
   \textquotedblleft{Development of the Transverse Beam Profile Monitors for the PAL-XFEL}\textquotedblright,
%  in \emph{Proc. IBIC2014}, Monterey, CA, USA, paper TUPD16, pp. 452--454,
%  in \emph{Proc. 3rd Int. Beam Instrumentation Conf.}, Monterey, CA, USA, paper TUPD16, pp. 452--454,
   in \emph{Proc. 3rd International Beam Instrumentation Conference}, Monterey, CA, USA, paper TUPD16, pp. 452--454,
    ISBN: 978-3-95450-141-0,
    \url{http://jacow.org/IBIC2014/papers/tupd16.pdf},
    2014.
