IBIC2013 - List of Authors (Shevelev, M.V.)

Paper

Title

Page

Extremely Low Emittance Beam Size Diagnostics with Sub-Micrometer Resolution Using Optical Transition Radiation

615

K.O. Kruchinin, S.T. Boogert, P. Karataev, L.J. Nevay
Royal Holloway, University of London, Surrey, United Kingdom
A.S. Aryshev, M.V. Shevelev, N. Terunuma, J. Urakawa
KEK, Ibaraki, Japan
B. Bolzon
The University of Liverpool, Liverpool, United Kingdom
B. Bolzon, T. Lefèvre, S. Mazzoni
CERN, Geneva, Switzerland

Transverse electron beam diagnostics is crucial for stable and reliable operation of the future electron-positron linear colliders such as CLIC or Higgs Factory. The-state-of-the-art in transverse beam diagnostics is based on the laser-wire technology. However, it requires a high power laser significantly increases the cost of the laser-wire system. Therefore, a simpler and relatively inexpensive method is required. A beam profile monitor based on Optical Transition Radiation (OTR) is very promising. The resolution of conventional OTR monitor is defined by a root-mean-square of the so-called Point Spread Function (PSF). In optical wavelength range the resolution is diffraction limited down to a few micrometers. However, in * we demonstrated that the OTR PSF has a structure which visibility can be used to monitor vertical beam size with sub-micrometer resolution. In this report we shall represent the recent experimental results of a micron-scale beam size measurement. We shall describe the entire method including calibration procedure, new analysis, and calculation of uncertainties. We shall discuss the hardware status and future plans.
* P. Karataev et al., Physical Review Letters 107, 174801 (2011).

Slides WEAL2 [5.120 MB]

Paper	Title	Page
WEAL2	Extremely Low Emittance Beam Size Diagnostics with Sub-Micrometer Resolution Using Optical Transition Radiation	615
	K.O. Kruchinin, S.T. Boogert, P. Karataev, L.J. Nevay Royal Holloway, University of London, Surrey, United Kingdom A.S. Aryshev, M.V. Shevelev, N. Terunuma, J. Urakawa KEK, Ibaraki, Japan B. Bolzon The University of Liverpool, Liverpool, United Kingdom B. Bolzon, T. Lefèvre, S. Mazzoni CERN, Geneva, Switzerland
	Transverse electron beam diagnostics is crucial for stable and reliable operation of the future electron-positron linear colliders such as CLIC or Higgs Factory. The-state-of-the-art in transverse beam diagnostics is based on the laser-wire technology. However, it requires a high power laser significantly increases the cost of the laser-wire system. Therefore, a simpler and relatively inexpensive method is required. A beam profile monitor based on Optical Transition Radiation (OTR) is very promising. The resolution of conventional OTR monitor is defined by a root-mean-square of the so-called Point Spread Function (PSF). In optical wavelength range the resolution is diffraction limited down to a few micrometers. However, in * we demonstrated that the OTR PSF has a structure which visibility can be used to monitor vertical beam size with sub-micrometer resolution. In this report we shall represent the recent experimental results of a micron-scale beam size measurement. We shall describe the entire method including calibration procedure, new analysis, and calculation of uncertainties. We shall discuss the hardware status and future plans. * P. Karataev et al., Physical Review Letters 107, 174801 (2011).
	Slides WEAL2 [5.120 MB]