Author: Harasimowicz, J.
Paper Title Page
TUPF02 Secondary Emission Monitor for keV Ion and Antiproton Beams 495
 
  • A.G. Sosa, E. Bravin, A. Jeff
    CERN, Geneva, Switzerland
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    Cockcroft Institute, Warrington, Cheshire, United Kingdom
  • J. Harasimowicz, A. Jeff, A.G. Sosa, C.P. Welsch
    The University of Liverpool, Liverpool, United Kingdom
  
  Funding: Work supported by the EU within the DITANET and CATHI projects under contracts 215080 and 264330, HGF and GSI under contract VH-NG-328 and STFC under the Cockcroft Institute core grant ST/G008248/1.
Beam pro­file mon­i­tor­ing of low in­ten­sity keV ion and an­tipro­ton beams re­mains a chal­leng­ing task. A Sec­ondary elec­tron Emis­sion Mon­i­tor (SEM) has been de­signed to mea­sure pro­files of beams with in­ten­si­ties below 107 and en­er­gies as low as 20 keV. The mon­i­tor is based on a two stage mi­crochan­nel plate (MCP) and a phos­phor screen fac­ing a CCD cam­era. Its mod­u­lar de­sign al­lows two dif­fer­ent op­er­a­tional se­tups. In this con­tri­bu­tion we pre­sent the de­sign of a pro­to­type and dis­cuss re­sults from mea­sure­ments with pro­tons at INFN-LNF and an­tipro­tons at the AEgIS ex­per­i­ment at CERN*. This is then used for a char­ac­ter­i­za­tion of the mon­i­tor with re­gard to its pos­si­ble fu­ture use at dif­fer­ent fa­cil­i­ties.
* Measurements at the AD carried out with the AEgIS collaboration. 		 
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