Author: Barth, J.
Paper Title Page
MOPF31 Design and Performance of the Biased Drift Tube System in the BNL Electron Lens 291
 
  • T.A. Miller, W. Fischer, D.M. Gassner, X. Gu, A.I. Pikin, S. Polizzo, P. Thieberger
    BNL, Upton, Long Island, New York, USA
  • J. Barth
    Barth Electronics, Boulder City, USA
 
  Funding: Work supported by U.S. DOE under contract No DE-AC02-98CH10886 with the U.S. Department of Energy.
The in­stal­la­tion of the Elec­tron Lenses in RHIC will be com­pleted this year. Its de­sign in­cludes a se­ries of drift tubes through which the elec­tron beam co­prop­a­gates, with the RHIC pro­ton beams. These drift tubes are used to cre­ate an elec­tric field gra­di­ent to sweep out ions that be­come trapped within the cen­tral mag­netic field where the elec­tron beam in­ter­acts with the pro­ton beams. These iso­lated drift tubes are bi­ased by high volt­age power sup­plies. With­out a path for the pro­ton beam image cur­rents, high volt­ages will de­velop on the drift tubes that can be detri­men­tal to the elec­tron beam and in­crease the RHIC ma­chine im­ped­ance. This paper pre­sents the de­sign of the drift tubes, axial elec­tric field gra­di­ent, and the cus­tom high volt­age RF bias tees that were de­signed to pro­vide sep­a­rate paths for the high fre­quency image cur­rents and the DC high volt­age bias over the same ca­bles. The de­sign and sim­u­la­tion of the bias tee is dis­cussed, as well as RF sig­nals from the pro­ton beam cur­rent im­aged on the drift tubes, as mea­sured through the bias tees dur­ing the com­mis­sion­ing of the blue RHIC beam elec­tron lens this past spring.
 
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