Author: Taylor, G.
Paper Title Page
MOCB04 Vertical Emittance Measurements using a Vertical Undulator 20
 
  • K.P. Wootton, R.P. Rassool, G. Taylor
    The University of Melbourne, Melbourne, Australia
  • M.J. Boland, B.C.C. Cowie, R.T. Dowd, Y.E. Tan
    ASCo, Clayton, Victoria, Australia
  • Y. Papaphilippou
    CERN, Geneva, Switzerland
 
  With vertical dimensions of several microns, direct measurement of beam size is approaching diffraction limits of visible light and hard x-ray emittance diagnostics. We report on the development of a new vertical electron beam size measurement and monitoring technique which utilizes a vertical undulator. An APPLE-II type undulator was phased to produce a horizontal magnetic field, deflecting the electron beam in the vertical plane. The measured ratios of undulator spectral peak heights are evaluated by fitting to simulations of the apparatus. Vertical electron beam emittances of several picometres have been observed at the Australian Synchrotron storage ring. With this apparatus immediately available at most existing electron and positron storage rings, we find this to be an appropriate and novel vertical emittance diagnostic.  
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