Author: Stulle, F.
Paper Title Page
MOPB87 Development and First Tests of a High Sensitivity Charge Monitor for SwissFEL 287
 
  • S. Artinian, J.F. Bergoz, F. Stulle
    BERGOZ Instrumentation, Saint Genis Pouilly, France
  • P. Pollet, V. Schlott
    PSI, Villigen PSI, Switzerland
 
  The compact X-ray free electron laser SwissFEL, which is presently under development at the Paul Scherrer Institut (PSI) in Villigen, Switzerland, will operate at comparably low charges, allowing the compression of the electron bunches to a few femto-seconds (nominal 200 pC mode) and even towards the atto-second range (short bunch 10 pC mode). A high precision charge measurement turns out to be a challenge, especially in the presence of dark currents, which may occur from high gradient RF gun and accelerating structure operation. In response to this challenge, a higher sensitivity charge transformer and new beam charge monitor electronics were developed in collaboration between Bergoz Instrumentation and PSI. The Turbo-ICT captures sub-pC bunch charge thanks to a new magnetic alloy exhibiting very low core loss. Transmission over a carrier using narrow-band cable television technique preserves the signal integrity from the Turbo-ICT to the BCM-RF. Electro-magnetic and RF interferences are strongly attenuated; the dark current signal is suppressed. First beam test results, which have been performed at the SwissFEL Test Injector Facility (STIF), are presented in this contribution.