IBIC2012 - List of Authors (Sakai, H.)

Paper	Title	Page
MOPB63	Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF	215
	T. Naito, H. Hayano, K. Kubo, S. Kuroda, N. Nakamura, T. Okugi, H. Sakai, N. Terunuma, J. Urakawa KEK, Ibaraki, Japan
	The X-ray profile monitor (XPM) is used for the beam size measurement in the KEK-ATF damping ring(ATF-DR) at all times. The XPM consists of a crystal monochromator, two Fresnel zone plates(FZPs) and X-ray CCD camera. Two FZPs make the imaging optics. The design resolution of the selected wavelength 3.8nm is less than 1μm, which is sufficiently small for the emittance measurement of the ATF-DR. However, the measured results at the early stage were affected by the mechanical vibration. This paper describes the improvement of the resolution and the measurement results.

Paper

Title

Page

Emittance Measurement using X-ray Beam Profile Monitor at KEK-ATF

215

T. Naito, H. Hayano, K. Kubo, S. Kuroda, N. Nakamura, T. Okugi, H. Sakai, N. Terunuma, J. Urakawa
KEK, Ibaraki, Japan

The X-ray profile monitor (XPM) is used for the beam size measurement in the KEK-ATF damping ring(ATF-DR) at all times. The XPM consists of a crystal monochromator, two Fresnel zone plates(FZPs) and X-ray CCD camera. Two FZPs make the imaging optics. The design resolution of the selected wavelength 3.8nm is less than 1μm, which is sufficiently small for the emittance measurement of the ATF-DR. However, the measured results at the early stage were affected by the mechanical vibration. This paper describes the improvement of the resolution and the measurement results.