Author: Perng, S.Y.
Paper Title Page
MOPB88 Beam Size Monitor for TPS 291
 
  • C.K. Kuan, S.Y. Perng, I.C. Sheng, T.C. Tseng
    NSRRC, Hsinchu, Taiwan
  • J.-R. Chen
    National Tsing Hua University, Hsinchu, Taiwan
 
  The third-generation light source TPS is under construction in NSRRC. There are two diagnostic beamlines in the storage ring. Visible SR interferometers and X-ray pinhole cameras are widely used to measure the transverse beam profile in synchrotron light sources. In phase-I we will adopt the two methods to be the beam size monitor. The visible SR interferometer uses a double slit to obtain one-dimensional interference pattern along the horizontal or vertical axis. The simple X-ray pinhole camera is designed for the measurement of the size, the emittance and energy spread of the electron beam. In this paper we present the design and calculation of the two beam size monitors for TPS.