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Low alpha beam lattice at Diamond can generate bunch length as small as 0.6ps. In order to be able to measure reliably such a short bunch, we have been optimising the optical design of the visible Diagnostics beamline, and we have implemented image processing, taking into account the point spread function of the streak camera. The beamline optical design has removed a large chirp of 15ps/150nm bandwidth to 2ps /200nmbandwidth. It has also permit the transport of almost all the available power, increasing the power by a factor 20, yet maintaining the possibility to focus the beam down to less than 20um into the streak camera for the best static streak camera point spread function. The deconvolution technique implemented extends the performance of the streak camera to bunch length measurement much smaller than the 1ps PSF of the streak camera. In this paper we present these two essential features required to measure sub-ps bunched with a streak camera.
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