IBIC2012 - List of Authors (Karataev, V.)

Paper

Title

Page

UV/X-ray Diffraction Radiation for Non-intercepting Micron-scale Beam Size Measurement

24

L.M. Bobb, N. Chritin, T. Lefèvre
CERN, Geneva, Switzerland
M.G. Billing
CLASSE, Ithaca, New York, USA
L.M. Bobb, V. Karataev
JAI, Egham, Surrey, United Kingdom

Diffraction Radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarizes the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. Therefore DR can be used to develop non-invasive diagnostic tools. The aim of this project is to measure the transverse (vertical) beam size using incoherent DR. To achieve the micron-scale resolution required by CLIC, DR in the UV and X-ray spectral-range must be investigated. During the next few years, experimental validation of such a scheme will be conducted on the CesrTA at Cornell University, USA. Here we present the current status of the experiment preparation.

Slides MOCC01 [3.064 MB]

WECA01

Theoretical and Experimental Investigation on Resolution of Optical Transition Radiation Transverse Beam Profile Monitor

A.S. Aryshev, N. Terunuma, J. Urakawa
KEK, Ibaraki, Japan
B. Bolzon, E. Bravin, T. Lefèvre
CERN, Geneva, Switzerland
S.T. Boogert, V. Karataev
Royal Holloway, University of London, Surrey, United Kingdom
L.J. Nevay
Oxford University, Physics Department, Oxford, Oxon, United Kingdom

Optical Transition Radiation (OTR) appearing when a charged particle crosses an interface between two media with different dielectric constants has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The basic tuning methods and operation of conventional OTR monitors are well established for transverse beam sizes not smaller than 3-5 um. Since the Point Spread Function (PSF) dimension defines the resolution of the conventional monitors, for small electron beam dimensions the PSF form significantly depends on a presence of OTR tails diffraction and aberrations in the optical system. In our experiment we have managed to squeeze the electron beam such that we can practically measure PSF distribution in one direction. The revealed PSF structure is such that the visibility depends on the transverse beam size on micron scale. We developed an empirical calibration technique and successfully overcame the resolution limit of the common OTR monitor reaching sub-micron level. Here we represent the recent developments and upgrades in both setup and data analysis of a sub-micrometer electron beam profile monitor.

Slides WECA01 [2.230 MB]

Paper	Title	Page
MOCC01	UV/X-ray Diffraction Radiation for Non-intercepting Micron-scale Beam Size Measurement	24
	L.M. Bobb, N. Chritin, T. Lefèvre CERN, Geneva, Switzerland M.G. Billing CLASSE, Ithaca, New York, USA L.M. Bobb, V. Karataev JAI, Egham, Surrey, United Kingdom
	Diffraction Radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarizes the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. Therefore DR can be used to develop non-invasive diagnostic tools. The aim of this project is to measure the transverse (vertical) beam size using incoherent DR. To achieve the micron-scale resolution required by CLIC, DR in the UV and X-ray spectral-range must be investigated. During the next few years, experimental validation of such a scheme will be conducted on the CesrTA at Cornell University, USA. Here we present the current status of the experiment preparation.
	Slides MOCC01 [3.064 MB]

WECA01	Theoretical and Experimental Investigation on Resolution of Optical Transition Radiation Transverse Beam Profile Monitor
	A.S. Aryshev, N. Terunuma, J. Urakawa KEK, Ibaraki, Japan B. Bolzon, E. Bravin, T. Lefèvre CERN, Geneva, Switzerland S.T. Boogert, V. Karataev Royal Holloway, University of London, Surrey, United Kingdom L.J. Nevay Oxford University, Physics Department, Oxford, Oxon, United Kingdom
	Optical Transition Radiation (OTR) appearing when a charged particle crosses an interface between two media with different dielectric constants has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The basic tuning methods and operation of conventional OTR monitors are well established for transverse beam sizes not smaller than 3-5 um. Since the Point Spread Function (PSF) dimension defines the resolution of the conventional monitors, for small electron beam dimensions the PSF form significantly depends on a presence of OTR tails diffraction and aberrations in the optical system. In our experiment we have managed to squeeze the electron beam such that we can practically measure PSF distribution in one direction. The revealed PSF structure is such that the visibility depends on the transverse beam size on micron scale. We developed an empirical calibration technique and successfully overcame the resolution limit of the common OTR monitor reaching sub-micron level. Here we represent the recent developments and upgrades in both setup and data analysis of a sub-micrometer electron beam profile monitor.
	Slides WECA01 [2.230 MB]