%\cite{Lee:FEL2015-WEP058}
\bibitem{Lee:FEL2015-WEP058}
    J.~Lee, J.H.~Han, J.H.~Hong, C.H.~Kim, I.S.~Ko, S.J.~Lee, \emph{et al.},
%   J. Lee \emph{et al.},
   \textquotedblleft{Emittance Measurements at the PAL-XFEL Injector Test Facility}\textquotedblright,
%  in \emph{Proc. FEL2015}, WEP058, pp. 690--693,
%  in \emph{Proc. FEL2015}, Daejeon, Republic of Korea, August 2015, paper WEP058, pp. 690--693,
   in \emph{Proc. 37th International Free Electron Laser Conference (FEL2015)}, Daejeon, Republic of Korea, August 2015, paper WEP058, pp. 690--693,
    ISBN: 978-3-95450-134-2,
    \url{http://accelconf.web.cern.ch/AccelConf/FEL2015/papers/wep058.pdf},
    doi:10.18429/JACoW-FEL2015-WEP058, 2015.
