• S.M. Matsubara
  RIKEN/SPring-8, Hyogo
• A. Maekawa
  The University of Tokyo, Nuclear Professional School, Ibaraki-ken
• H. Tomizawa
  JASRI/SPring-8, Hyogo-ken

High-brightness electron bunches are required with low slice emittance and bunch length of 30 fs (FWHM) in a targeting lasing part for XFEL/Spring-8. In order to obtain maximum brightness, it is very important to measure 3D bunch charge distribution (BCD) in real-time for future X-ray light sources (XFEL, ERL, etc). Therefore, we are developing a single-shot, non-destructive, and real-time 3D-BCD monitor based on Electro-Optical Sampling with a manner of spectral decoding. The monitor system requires for a probe laser source to realize a higher temporal resolution. The laser source has broad spectrum of over 400 nm width and a linear-chirp of over 3,000 fs² to be few-ps pulse duration. Then, the shape in the frequency regions is rectangular. The liner-chirp is supplied by using a broadband AO-modulator (DAZZLER) which is possible to remove higher order dispersions. The laser pulses will be amplified to be micro-joule pulse-energy with a manner of NOPA. The laser source with such as the properties is mentioned in this report. We expect the feasibility of 20 fs temporal resolution by using this laser source with an organic crystal such as a DAST crystal.