ECRIS2010 - List of Authors (Kauppinen, J.A.)

Paper

Title

Page

Effects of Microwave Frequency Fine Tuning on the Performance of JYFL 14 GHz ECRIS

137

V.A. Toivanen, V.P. Aho, J. Ärje, P. Jones, J.A. Kauppinen, H. A. Koivisto, P. Peura, O.A. Tarvainen
JYFL, Jyväskylä, Finland
L. Celona, G. Ciavola, S. Gammino
INFN/LNS, Catania, Italy
A. Galatà
INFN/LNL, Legnaro (PD), Italy
D. Mascali
CSFNSM, Catania, Italy
T. Ropponen
NSCL, East Lansing, Michigan, USA

Measurements have been carried out at Department of Physics, University of Jyväskylä (JYFL) to study the effects of microwave frequency fine tuning on the performance of JYFL 14 GHz electron cyclotron resonance ion source. The frequency was varied within an 85 MHz band around the normal operation frequency of 14.085 GHz. The radial bremsstrahlung emission was measured for plasma diagnostics purposes and mass separated ion beam currents extracted from the ion source were recorded at the same time. Also, beam quality studies were conducted by measuring the ion beam emittance and shape with and without enhanced space charge compensation. The obtained results are presented and possible origins of seen phenomena in measured quantities are discussed.

Poster TUPOT010 [0.678 MB]

Paper	Title	Page
TUPOT010	Effects of Microwave Frequency Fine Tuning on the Performance of JYFL 14 GHz ECRIS	137
	V.A. Toivanen, V.P. Aho, J. Ärje, P. Jones, J.A. Kauppinen, H. A. Koivisto, P. Peura, O.A. Tarvainen JYFL, Jyväskylä, Finland L. Celona, G. Ciavola, S. Gammino INFN/LNS, Catania, Italy A. Galatà INFN/LNL, Legnaro (PD), Italy D. Mascali CSFNSM, Catania, Italy T. Ropponen NSCL, East Lansing, Michigan, USA
	Measurements have been carried out at Department of Physics, University of Jyväskylä (JYFL) to study the effects of microwave frequency fine tuning on the performance of JYFL 14 GHz electron cyclotron resonance ion source. The frequency was varied within an 85 MHz band around the normal operation frequency of 14.085 GHz. The radial bremsstrahlung emission was measured for plasma diagnostics purposes and mass separated ion beam currents extracted from the ion source were recorded at the same time. Also, beam quality studies were conducted by measuring the ion beam emittance and shape with and without enhanced space charge compensation. The obtained results are presented and possible origins of seen phenomena in measured quantities are discussed.
	Poster TUPOT010 [0.678 MB]