DIPAC2011 - List of Authors (Zschornack, G.)

Paper	Title	Page
MOPD88	Electron Beam Ion Sources, Ion Optical Elements and Beam Diagnostics for Particle Accelerators	254
	F. Ullmann, V.P. Ovsyannikov, M. Schmidt DREEBIT GmbH, Dresden, Germany G. Zschornack Technische Universität Dresden, Institut für Angewandte Physik, Dresden, Germany
	Electron Beam Ion Sources (EBISs) provide highly charged ions (HCIs) for a variety of investigations and applications, amongst others as injection source for particle accelerators. EBISs feature a lot of advantages which qualify them for accelerator injection, and which partly compensate their comparatively low number of particles. DREEBIT GmbH provides a family of compact EBISs based on permanent magnets. A more sophisticated version is based on cryogen-free superconducting magnets providing a higher ion output. Its compact design makes them transportable, low in operational costs, and guarantee easy handling. We present latest improvements and measurements proving the feasibility of producing beams of HCIs with convenient beam properties such as low transversal and longitudinal emittance. In addition we present a variety of ion optical elements and ion beam diagnostics. The DREEBIT Wien filter allows for the charge mass separation. The DREEBIT Pepper-pot Emittance Meter allows for emittance measurements of beams of a wide range of particle intensity. Other beam diagnostics are provided, such as Beam Imaging System, Retarding Field Analyzer and different kinds of Faraday cups.

Paper

Title

Page

Electron Beam Ion Sources, Ion Optical Elements and Beam Diagnostics for Particle Accelerators

254

F. Ullmann, V.P. Ovsyannikov, M. Schmidt
DREEBIT GmbH, Dresden, Germany
G. Zschornack
Technische Universität Dresden, Institut für Angewandte Physik, Dresden, Germany

Electron Beam Ion Sources (EBISs) provide highly charged ions (HCIs) for a variety of investigations and applications, amongst others as injection source for particle accelerators. EBISs feature a lot of advantages which qualify them for accelerator injection, and which partly compensate their comparatively low number of particles. DREEBIT GmbH provides a family of compact EBISs based on permanent magnets. A more sophisticated version is based on cryogen-free superconducting magnets providing a higher ion output. Its compact design makes them transportable, low in operational costs, and guarantee easy handling. We present latest improvements and measurements proving the feasibility of producing beams of HCIs with convenient beam properties such as low transversal and longitudinal emittance. In addition we present a variety of ion optical elements and ion beam diagnostics. The DREEBIT Wien filter allows for the charge mass separation. The DREEBIT Pepper-pot Emittance Meter allows for emittance measurements of beams of a wide range of particle intensity. Other beam diagnostics are provided, such as Beam Imaging System, Retarding Field Analyzer and different kinds of Faraday cups.