DIPAC2011 - List of Authors (Woodley, M.)

Paper	Title	Page
TUPD61	Multi Optical Transition Radiation System for ATF2	446
	C. Blanch Gutierrez, J. Alabau-Gonzalvo, A. Faus-Golfe, J.J. García-Garrigós IFIC, Valencia, Spain J. Cruz, D.J. McCormick, G.R. White, M. Woodley SLAC, Menlo Park, California, USA
	Funding: FPA2010-21456-C02-00 In this paper we describe the calibration tests, software development and first measurements of a Multi Optical Transition Radiation System in the beam diagnostic section of the Extraction (EXT) line of ATF2, close to the multi wire scanner system. First 2D emittance measurements have been made with success and the system is being used normally for coupling correction. 4D emittance reconstruction algorithm is under improvement and implementation before a systematic measurement campaign and comparison with wire scanners is done. This will be a definitive test of the OTR as a beam emittance diagnostic device, which will give the ability to measure the beam emittance with high statistics, giving a low error and a good understanding of emittance jitter.

Paper

Title

Page

Multi Optical Transition Radiation System for ATF2

446

C. Blanch Gutierrez, J. Alabau-Gonzalvo, A. Faus-Golfe, J.J. García-Garrigós
IFIC, Valencia, Spain
J. Cruz, D.J. McCormick, G.R. White, M. Woodley
SLAC, Menlo Park, California, USA

Funding: FPA2010-21456-C02-00
In this paper we describe the calibration tests, software development and first measurements of a Multi Optical Transition Radiation System in the beam diagnostic section of the Extraction (EXT) line of ATF2, close to the multi wire scanner system. First 2D emittance measurements have been made with success and the system is being used normally for coupling correction. 4D emittance reconstruction algorithm is under improvement and implementation before a systematic measurement campaign and comparison with wire scanners is done. This will be a definitive test of the OTR as a beam emittance diagnostic device, which will give the ability to measure the beam emittance with high statistics, giving a low error and a good understanding of emittance jitter.