Author: Suzuki, S.
Paper Title Page
MOOB03 Diamond-based Beam Halo Monitor Equipped with RF Fingers for SACLA 12
 
  • H. Aoyagi, T. Aoki, T. Bizen, K. Fukami, N. Nariyama, S. Suzuki
    JASRI/SPring-8, Hyogo-ken, Japan
  • Y. Asano, T. Itoga, H. Kitamura, T. Tanaka
    RIKEN/SPring-8, Hyogo, Japan
 
  Funding: This work is partly supported by Japan Society for the Promotion of Science, Grant-in-Aid for Scientific Research (c) 21604017.
The diamond-based beam halo monitor has been developed for SPring-8 Angstrom Compact free electron LAser (SACLA). This monitor is an interlock sensor to protect the undulator magnets against radiation damage. Pulse-mode measurement is adopted to suppress the background noise efficiently. The diamond detectors are dipped into the beam duct in order that the intensity of the beam halo can be measured directly. However, it is important issue to avoid degradation in quality of electron beam for SPring-8 XFEL. We designed new RF fingers with aluminum windows in order to reduce the impedance to the beam. The RF fingers are made of beryllium copper, and having the aluminum windows, which is low-Z material, in front of active areas of the diamond detectors. Therefore, the influence of secondary electrons and bremsstrahlung from the finger material can be suppressed. To evaluate influence on the output signal of the diamond detector by changing the finger material, both the simulation study and the experimental measurement have been carried out. Feasibility tests of this monitor, which is equipped with the RF fingers, have also been demonstrated at the SCSS test accelerator.
 
slides icon Slides MOOB03 [1.353 MB]  
 
TUPD68 Feasibility Study for a Single-Shot 3D Electron Bunch Charge Distribution Monitor with a Polarized Probe Laser at SPring-8 Photoinjector 464
 
  • Y. Okayasu, H. Dewa, H. Hanaki, S. Matsubara, A. Mizuno, S. Suzuki, T. Taniuchi, H. Tomizawa, K. Yanagida
    JASRI/SPring-8, Hyogo-ken, Japan
  • T. Ishikawa
    RIKEN Spring-8 Harima, Hyogo, Japan
  • A. Maekawa, M. Uesaka
    The University of Tokyo, Nuclear Professional School, Ibaraki-ken, Japan
 
  It is essential for precise characterizations of light sources to monitor ever-changing charge distribution of electron bunch by single-shot measurement with high resolutions. Therefore, a single-shot and non-destructive 3D bunch charge distribution (BCD) monitor was developed to characterize longitudinal and transverse BCDs simultaneously. It is based on Electro-Optical (EO) multiple sampling with a manner of spectral decoding. For the transverse detection, eight EO-crystals surround the beam axis azimuthally, and a linear-chirped probe laser pulse with a hollow shape and spirally temporal shift, passes through the EO-crystals. A principle verification experiment has been successfully carried out with two EO-crystals in our facility. In addition, we are promoting a numerical calculation of the ultra-short and radial polarized laser transportation for our own system assuming eight EO-crystals usage in order to confirm observation feasibility. We report the principle and the first experimental results of the novel 3D-BCD monitor and introduce the feasibility demonstration with a calculation about a propagation of transverse polarization distributions along probe laser optics.  
poster icon Poster TUPD68 [4.684 MB]