GSI, Darmstadt, Germany
TU Darmstadt, Darmstadt, Germany
Various scintillation screens were irradiated with high energy ion beams as extracted from the GSI synchrotron SIS18. Their imaging properties were studied with the goal to achieve a precise transverse profile determination. Scintillation images were characterized with respect to the light yield and statistical moments of the light distribution i.e. imaged beam width and shape. To study the scintillation properties over a wide range of intensities a 300 MeV/u Uranium ion beam with 104 to 109 particles per pulse was applied. Sensitive scintillators, namely CsI:Tl, YAG:Ce, P43 and Ce-doped glass were investigated for lower beam currents. Ceramics like Al2O3, Al2O3:Cr, ZrO2:Y and ZrO2:Mg as well as Herasil-glass were studied up to the maximum beam currents. For the various screens remarkable differences have been observed, e.g. the recorded profile width varies by nearly a factor of two. The obtained results serve as a basis for an appropriate choice of scintillator materials, which have to cope with the diversity of ion species and intensities at FAIR.
