Paper | Title | Page |
---|---|---|
MOPD60 | Beam Induced Fluorescence (BIF) Monitors as a Standard Operating Tool | 185 |
|
||
For high current operation at the GSI Heavy Ion UNILAC non intercepting methods for transverse beam profile determination are required. The Beam Induced Fluorescence (BIF) Monitor, an optical measurement device based on the observation of fluorescent light emitted by excited gas molecules was brought to routine operation. Detailed investigations were conducted for various beam parameters to improve the electronics and the optical setup. Up to now, four BIF monitor stations (for detection of both, horizontal and vertical beam profiles) were installed at UNILAC and two additional setups are planned. This contribution reports on first upgrades of the BIF monitors with a Siemens PLC for FESA-based slow controls and hardware protection procedures. The versatile control and display software ProfileView is presented as an easy-to-use and stable beam diagnostic tool for the GSI operating team. | ||
![]() |
Poster MOPD60 [3.060 MB] | |