Paper |
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TUPD40 |
Analysis of the Post-mortem Events at the TLS |
392 |
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- K.H. Hu, Y.-T. Chang, J. Chen, P.C. Chiu, K.T. Hsu, C.H. Kuo, Y.-H. Lin, Y.R. Pan
NSRRC, Hsinchu, Taiwan
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Analyzing the reasons of various trip events are basis to improve reliability of a accelerator system. Understand the mechanisms caused trip of the machine will be very helpful to decide what the adequate measures to improve availability. To identify the causes of trips at Taiwan Light Source (TLS), various diagnostics tool were employed. These diagnostic tools can capture beam trips, interlock signals of superconducting RF system, quench and interlock signals of the superconducting insertion device, waveform of the injection kickers, and instability signals of the stored beam for post-mortem analysis. Various functionalities of trip diagnostic are supported. Available tools and experiences will be summarized in this report.
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