DIPAC2011 - List of Authors (Kleen, W.)

Paper

Title

Page

Dark Current Monitor for the European XFEL

572

D. Lipka, W. Kleen, J. Lund-Nielsen, D. Nölle, S. Vilcins, V. Vogel
DESY, Hamburg, Germany

Dark current is produced due from field emission in the accelerator. This generates a radiation background in the tunnel which damages the electronics and activates components. To decrease the dark current different methods like kickers and collimators are used. To control the dark current level and measure and optimize the efficiency of dark current reduction dark current monitors are required. To measure the dark current a cavity was designed and built with the operation frequency of the accelerator. Here the small charge of the dark current present in every RF bucket induces and superimposes a field up to a measurable level. The cavity is proven at the PITZ facility. In addition to dark current levels down to 50 nA, the monitor allows for charge measurements resolution below pC, better than the Faraday cup. In addition the ratio of amplitudes from higher order monopole modes is a function of the bunch length. Measurements show the same trend of bunch length compared with a destructive streak camera method with comparable resolution. Therefore this monitor is able to measure bunch charge, dark current and bunch length in a non-destructive manner.

Slides WEOC03 [0.935 MB]

Paper	Title	Page
WEOC03	Dark Current Monitor for the European XFEL	572
	D. Lipka, W. Kleen, J. Lund-Nielsen, D. Nölle, S. Vilcins, V. Vogel DESY, Hamburg, Germany
	Dark current is produced due from field emission in the accelerator. This generates a radiation background in the tunnel which damages the electronics and activates components. To decrease the dark current different methods like kickers and collimators are used. To control the dark current level and measure and optimize the efficiency of dark current reduction dark current monitors are required. To measure the dark current a cavity was designed and built with the operation frequency of the accelerator. Here the small charge of the dark current present in every RF bucket induces and superimposes a field up to a measurable level. The cavity is proven at the PITZ facility. In addition to dark current levels down to 50 nA, the monitor allows for charge measurements resolution below pC, better than the Faraday cup. In addition the ratio of amplitudes from higher order monopole modes is a function of the bunch length. Measurements show the same trend of bunch length compared with a destructive streak camera method with comparable resolution. Therefore this monitor is able to measure bunch charge, dark current and bunch length in a non-destructive manner.
	Slides WEOC03 [0.935 MB]