Paper |
Title |
Page |
TUPD38 |
Design of a Single-Shot Prism Spectrometer in the Near- and Mid-Infrared Wavelength Range for Ultra-Short Bunch Length Diagnostics |
386 |
|
- C. Behrens
DESY, Hamburg, Germany
- A.S. Fisher, J.C. Frisch, A. Gilevich, H. Loos, J. Loos
SLAC, Menlo Park, California, USA
|
|
|
The successful operation of high-gain free-electron lasers (FEL) relies on the understanding, manipulation, and control of the parameters of the driving electron bunch. Present and future FEL facilities have the tendency to push the parameters for even shorter bunches with lengths below 10 fs and charges well below 100 pC. This is also the order of magnitude at laser-driven plasma-based electron accelerators. Devices to diagnose such ultra-short bunches even need longitudinal resolutions smaller than the bunch lengths, i.e. in the range of a few femtoseconds. This resolution is currently out of reach with time-domain diagnostics like RF-based deflectors, and approaches in the frequency-domain have to be considered to overcome this limitation. Our approach is to extract the information on the longitudinal bunch profile by means of infrared spectroscopy using a prism as dispersive element. In this paper, we present the design considerations on a broadband single-shot spectrometer in the near- and mid-infrared wavelength range (0.8 - 39.0 μm).
|
|
|