Author: De Villiers, J.G.
Paper Title Page
TUPD51 Ionization Profile Monitors - IPM @ GSI 419
 
  • T. Giacomini, P. Forck
    GSI, Darmstadt, Germany
  • J.G. De Villiers
    iThemba LABS, Somerset West, South Africa
  • J. Dietrich
    FZJ, Jülich, Germany
  • D.A. Liakin
    ITEP, Moscow, Russia
 
  The Ionization Profile Monitor in the SIS18 is frequently used for machine development. The permanent availability and the elaborated software user interface make it easy and comfortable to use. Additional to the beam profile data the device records the data of synchrotron dc current, dipole ramp and accelerating rf properties. The trend curves of these data are shown correlated to the beam profile evolution for a full synchrotron cycle from injection to extraction with 100 profiles/s. The reliable function is based on the optimized in-vacuum hardware design, like the stable high voltage connections, the electric field box with very uniform field distribution and the uv-light based calibration system. The permanent availability is based on the convenient software interface using the Qt library. A new IPM generation was recently commissioned in the experimental storage ring ESR at GSI and one in the COSY ring at FZ-Jülich. These monitors are enhancements of the SIS18 multiwire IPM but equipped with an especially developed large area 50x100 mm2 optical particle detector of rectangular shape that is readout by a digital camera through a viewport.