DIPAC2011 - List of Authors (Adamczewski-Musch, J.)

Paper

Title

Page

SEM-GRID Prototype Electronics using Charge-Frequency-Converters

176

M. Witthaus, J. Adamczewski-Musch, H. Flemming, J. Frühauf, S. Löchner, H. Reeg, P. Skott
GSI, Darmstadt, Germany

A prototype system using an ASIC equipped with 8 Charge-to-Frequency Converters (CFC) was developed in collaboration between the Beam Diagnostics and Experiment Electronics Department at GSI. The maximum sensitivity is 250 fC per output pulse. It will serve as an economic alternative for the readout electronics of Secondary Electron Monitor (SEM)profile grids or comparable beam diagnostic devices like Multi-Wire Proportional Chambers (MWPC). The goal of this contribution is to report on a detailed performance test under real beam conditions at GSI beam lines. A 32-channel electronics is connected to different beam profile SEM-grids at a LINAC beam line and tested with various beam conditions. Transversal beam profiles with a time resolution down to the microsecond range have been recorded successfully. Beam profiles recorded with the new CFC-board and the old standard trans-impedance amplifiers agreed well. Further measurements were done with Multi-Wire Proportional Chamber. Therefore the prototype was extended to 64-input channels recently.

Poster MOPD55 [1.344 MB]

Paper	Title	Page
MOPD55	SEM-GRID Prototype Electronics using Charge-Frequency-Converters	176
	M. Witthaus, J. Adamczewski-Musch, H. Flemming, J. Frühauf, S. Löchner, H. Reeg, P. Skott GSI, Darmstadt, Germany
	A prototype system using an ASIC equipped with 8 Charge-to-Frequency Converters (CFC) was developed in collaboration between the Beam Diagnostics and Experiment Electronics Department at GSI. The maximum sensitivity is 250 fC per output pulse. It will serve as an economic alternative for the readout electronics of Secondary Electron Monitor (SEM)profile grids or comparable beam diagnostic devices like Multi-Wire Proportional Chambers (MWPC). The goal of this contribution is to report on a detailed performance test under real beam conditions at GSI beam lines. A 32-channel electronics is connected to different beam profile SEM-grids at a LINAC beam line and tested with various beam conditions. Transversal beam profiles with a time resolution down to the microsecond range have been recorded successfully. Beam profiles recorded with the new CFC-board and the old standard trans-impedance amplifiers agreed well. Further measurements were done with Multi-Wire Proportional Chamber. Therefore the prototype was extended to 64-input channels recently.
	Poster MOPD55 [1.344 MB]