• B.X. Yang, S.E. Shoaf, J.B. Stevens
  ANL, Argonne
• W.E. Norum
  LBNL, Berkeley, California

Time-correlated single-photon counting (TCSPC) techniques have been used for bunch purity measurement since the Advanced Photon Source started operations. Over the past three years, improvements made in the monitor have increased the signal-to-noise ratio and dynamic range to above 10 billion. Recently, improvements of the timing resolution of TCSPC to < 50 ps FWHM allowed us to measure the longitudinal profile of individual bunches in the APS storage ring. The profile monitor uses a visible-light single-photon avalanche photodiode (SPAD) and a PicoHarp 300 TCSPC unit. Due to its robustness, the system operates continuously and measures the average longitudinal profile of the stored beam, updating the process variables for bunch phases and bunch lengths in intervals less than 30 seconds. In a third application, using a TCSPC x-ray detector with an x-ray wire scanner in the monochromatic beam of the diagnostics undulator, measurements of transverse profiles of individual bunches can be completed in less than 30 minutes. Since the beam sizes and phases are dependent on the bunch charge, these online tools will provide users with valuable information performing timing experiments.