Paper | Title | Page |
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TUPSM103 | Recent Upgrade of the PITZ Facility | 459 |
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The Photo Injector Test facility at DESY Zeuthen site (PITZ) is dedicated to developing and optimizing high brightness electron sources for short wavelength Free-Electron Lasers (FELs) like FLASH and the European XFEL, both in Hamburg (Germany). Since October 2009 a major upgrade has been ongoing with the goal of improving the accelerating components, the photocathode drive laser system, and the beam diagnostics. The previously operated and fully characterized gun was brought to FLASH and will go into operation soon. A gun of the same type is installed now in PITZ. The conditioning has started and the gun will be characterized throughout 2010. A new booster cavity, Cut Disk Structure (CDS), was developed and will be mounted at PITZ in spring 2010. The booster cavity will be able to accelerate electrons above 20 MeV/c and will be suitable for long RF pulses. The most important upgrade of the diagnostics system will be the implementation of a phase space tomography module (PST) consisting of three FODO cells each surrounded by two screen stations. The results of commissioning, gun and booster conditioning and the very first measurements will be reported. |
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TUPSM057 | Emittance Measurement Wizard at PITZ | 282 |
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The Photo Injector Test Facility at DESY, Zeuthen site (PITZ) develops electron sources of high brightness beams, required for linac based free electron lasers (FELs) like FLASH or the European XFEL. One of the key issues in electron beam optimization is the minimization of the transverse emittance. The main method to measure emittance at PITZ is a single slit scan technique, implying local beam divergence measurement by insertion of the slit mask at a definite location within the beam and measurements of the transmitted beamlet profile downstream of the slit station. “Emittance Measurement Wizard” (EMWiz) is the program used by PITZ operators for automated emittance measurements. EMWiz combines an acquisition program for beam and beamlet image recording and a postprocessing tool for the analysis of the measured transverse phase space of the electron beam. It provides a way to execute the difficult emittance measurements in an automatic mode and to get a calculated emittance result. |