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Della Penna, A.J.

Paper Title Page
TUPSM037 NSLS-II RF Beam Position Monitor 205
 
  • K. Vetter, J.H. DeLong, A.J. Della Penna, K.M. Ha, B.N. Kosciuk, J. Mead, I. Pinayev, O. Singh, Y. Tian
    BNL, Upton, Long Island, New York
 
 

An internal R&D program has been undertaken at BNL to develop an RF BPM to meet all requirements of both the injection system and storage ring. The RF BPM architecture consists of an Analog Front-End (AFE) board and a Digital Front-End board (DFE) contained in a 1U 19" chassis. An external passive RF signal processor has been developed that will be located near the RF BPM pickups. The partitioning into two boards enables a flexible Software Defined Instrument. A model-based design flow has been adopted utilizing AWR VSS, Simulink, and Xilinx System Generator for algorithm development and AFE impairment performance analysis. The DFE architecture consists of a Virtex-6 with MicroBlaze embedded processor. An optional Intel Atom SBC is also supported. The AFE is based on a bandpass sampling architecture utilizing 16-bit ADCs. Long-term drift is corrected by inclusion of an out-of-band calibration tone. An RF BPM Calibration Tool is being developed for removal of systematic errors and performance verification. In this contribution we will present a detailed overview of the architecture, compare simulation results to laboratory performance, and report beam test results.

 
TUPSM097 ADC Considerations and Analysis for Band Pass Sampling Systems 434
 
  • A.J. Della Penna
    BNL, Upton, Long Island, New York
 
 

With increasing demand for acquiring data at high speed with high resolution, more digitizers have become available for this purpose. With the higher speed digitizers becoming faster and faster at these higher data rates with higher resolutions, choosing the proper digitizer for a design, is not just a matter of number of bits. Deciding factors such as jitter, to maximize the ENOB and linearity over the band of interest, and most importantly phase noise should factor into your selection. Does the part you are evaluating match with the data sheet? If not, what is different in your test setup? Your evaluation can only be as good as the equipment you are using to test the device. With the availability of evaluation boards from almost any of the ADC vendors, a more in-depth evaluation can be performed fairly easily. Even the GUI interface is usually included with the evaluation board. So for a small investment on several choices, you can make a side by side comparison and see actual results.