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Morinaga, T.

Paper Title Page
THP050 RF Test Stand Control System for XFEL/SPring-8 762
 
  • T. Fukui, T. Hasegawa, N. Hosoda, H. Maesaka, T. Ohshima, Y. Otake, K. Shirasawa
    RIKEN/SPring-8, Hyogo
  • T. Masuda, T. Morinaga, T. Ohata, S. Takahashi, M. Yamaga, A. Yamashita
    JASRI/SPring-8, Hyogo-ken
 
  The X-ray free electron laser (XFEL) facility is under construction at SPring-8. An rf test stand was build for the XFEL to assure performance of the delivered rf components under the high-power condition and to establish a conditioning procedure for stable operation with design rf power. In addition, the test stand is used to confirm a performance of a low-level rf system, a precise water temperature control system, a vacuum system and an rf high power system. In this paper we describe a software framework to control those equipment and test results of a newly developed software component include device drivers with Solaris 10 for x86.