MP515 (POSTER)
	Data Acquisition and Fault Diagnostic System of Samsung Superconductor Test Facility		75
	Y. Chu, H. Yonekawa, S. Baek, Y.K. Oh, S. Lee, W. Chung, K. Park, B. Lim, H. Park, K. Kim (KBSI) S. Lee (FREECOM SYSTEM LTD)