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- K. H. Hu, J. Chen, P. C. Chiu, K. T. Hsu, S. Y. Hsu, C. H. Kuo, D. Lee, C.-J. Wang, C. Y. Wu
NSRRC, Hsinchu
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Analyzing the reasons of various trip events is essential to improve reliability of a synchrotron light source. To identify the causes of trip at Taiwan Light Source (TLS), various diagnostics tool were employed. These diagnostic tools can capture beam trip, interlock signals of superconducting RF system, waveform of the injection kickers, quench and interlock signals of the superconducting insertion device, and instability signals of the stored beam for post-mortem analysis. These diagnostics can be routine monitor signal and record beam trip event. Features of trip diagnostic tools are available now. System configuration experiences will be summarized in this report.
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