| Paper |
Title |
Page |
| WEPLT091 |
Frequency Map Analysis with the Insertion Devices at ELETTRA
|
2059 |
| |
- S. Di Mitri, L. Tosi
ELETTRA, Basovizza, Trieste
- L.G. Liu
SSRF, Shanghai
|
|
| |
Frequency map analysis is a very efficient technique for the understanding of the resonances which may affect the stability of the electrons. Measurements correlated to simulations can provide a method to improve beam lifetime and injection efficiency that is particulary important in the case of top up operation. In this paper, the results of frequency map measurements and simulations for the ELETTRA storage ring are presented both for the bare lattice as well as for the case in which insertion devices are operational.
|
|