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Kost, D.

Paper Title Page
TUPLT023 A New Ion Beam Beam Facility for Slow Highly Charged Ions 1189
 
  • G. Zschornack, S. Landgraf
    TU Dresden, Dresden
  • S. Facsko, D. Kost, W. Möller, H. Tyrroff
    FZR, Dresden
  • F. Grossmann, U. Kentsch, V.P. Ovsyannikov, M. Schmidt, F. Ullmann
    Leybold Vacuum Dresden, Dresden
  
  A new ion beam facility for slow highly charged ions is presented. It will provide slow highly charged ions from an Electron Cyclotron Resonance (ECR) ion source as well as very highly charged ions at lower ion currents from an Electron Beam Ion Trap (EBIT). As ECR ion source a SUPERNANOGAN source* is applied. The Dresden EBIT**, a room-temperature EBIT, is used to produce comparatively low currents of very highly charged ions. This very compact and long-term stable device is producing highly charged ions at ultimate low costs. The Dresden EBIT working with electron energies up to 15 keV at electron currents up to 50 mA is able to produce bare nuclei up to nickel as Fe26+ or Ni28+, helium-like ions for medium Z such as Ge30+ or Kr34+ and neon-like ions for elements of the high-Z region such as Xe44+ or Ir67+. The ion currents extracted from the Dresden EBIT are typically in the range of some nA per pulse. With the new ion beam facility outstanding possibilities for a wide range of investigations are opened up in areas such as surface analysis, materials science and nanotechnology as well as for basic research in different fields as for instance in atomic and solid state physics.

*The Pantechnik Catalogue, August 2001 Edition, Caen 2001, France **V.P.Ovsyannikov, G.Zschornack; Review of Scientific Instruments, 70 (1999) 2646