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The thermal emittance of photoemitted electrons in an RF gun is a crucial parameter for short wavelength FELs and future high luminosity electron colliders. An estimate of the thermal emittance of semiconductor and metal samples, commonly used as photocathodes, has been assessed using a Time-Of-Flight spectrometer. In this paper we present the analysis, based on angle resolved photoemission measurements, of both the cesium telluride (Cs2Te) photocathode films as used at the TESLA Test Facility, and polycrystalline metals. These latter measurements, at different laser wavelengths, are used to validate both our experimental apparatus and the thermal emittance reconstruction technique developed.
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